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A. Ahmad
A. Host-Madsen
J. Giglmayr
Kwang Mong Sim
L. Ludman
R. S. Ramakrishna
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Ki Soo Chang, Jin Dong Song, Jong Min Kim, Chang Yoon Lee, Yong Tak Lee
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Growth of GaAs/AlAs DBR mirror by MBE with in-situ growth rate calibration for 980nm VCSELs
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Ki Soo Chang, Jin Dong Song, Jong Min Kim, Chang Yoon Lee, Yong Tak Lee, "Growth of GaAs/AlAs DBR mirror by MBE with in-situ growth rate calibration for 980nm VCSELs,"
Proceedings of Photonics Conference 2001
, pp. 485-486, 2001.
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 Àå±â¼ö-980nm VCSELÀ» À§ÇÑ.pdf (213KB)
  
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Acknowledgment
Keywords
VCSEL, DBR mirror, reflectometry, RHEED oscillation
Abstract
Uniform epitaxial growth of 22-period GaAs/AlAs DBR was achieved on 2-inch GaAs substrates by MBE using In-solder-free holder. In-situ optical reflectometry and RHEED oscillations methods were used for pregrowth calibration of growth rate. The reflectivity was found to be 99.4% at the center wavelength of the mirror stop -band. The variation in the center wavelength over a 2-inch wafer was within ¡¾0.36%.
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